When is IEEE VLSI Test Symposium 2026?

2026-04-27–2026-04-29. The organizer has not published a time in this record.

Where is IEEE VLSI Test Symposium 2026?

It is listed for Napa Marriott, Napa, CA, United States. Recheck the official guide and the map link below for the exact venue scope.

How do I register or attend?

A direct registration URL has not been officially verified in this record. Use the organizer’s page for the latest attendance instructions.

How current is this information?

This page preserves 2 sources, including IEEE Test Technology Technical Council · official event page, and was last reviewed on 2026-08-19. Recheck the official page before booking.

2026-04-27 — 2026-04-29 · PAST EDITION

Industry & academia

IEEE VLSI Test Symposium 2026

Conference organized by IEEE Test Technology Technical Council, focused on Test / Reliability, Hardware Security, Advanced Packaging, Design / EDA.

Registration

This edition has ended. Explore the archive and future editions.

2026-04-27 → 2026-04-29 · Napa Marriott

Early-bird deadline: Not published
Registration deadline: Not published

Check the organizer’s website ↗

WHEN2026-04-27 — 2026-04-29All-day · time not announced

WHERENapa Marriott · Napa, CA · United StatesIn person · Conference

FOCUSTest / Reliability · Hardware Security · Advanced PackagingIEEE Test Technology Technical Council

TRUSTOFFICIAL SOURCE2 sources · 2026-08-19

OFFICIAL PAGE ↗GOOGLE CALENDAR ＋APPLE / .ICS ↓WEEKLY EVENT BRIEFING ↗DEADLINE & CHANGE ALERT ↓

EVENT BRIEFING

What to know before IEEE VLSI Test Symposium 2026

A decision-ready event record: confirmed logistics, attendance path, programme status and a traceable source trail.

EVENT OVERVIEW

IEEE VLSI Test Symposium 2026 is a in person conference organized by IEEE Test Technology Technical Council. This guide separates confirmed event facts from details the organizer has not yet published, so a visitor can make a practical attendance decision without treating a calendar listing as a promise.

This edition is listed for 2026-04-27–2026-04-29 in Napa Marriott, Napa, CA, United States. The record is organized around Test / Reliability, Hardware Security, Advanced Packaging, Design / EDA; use the official materials for the final programme, speaker line-up and any last-minute venue or registration changes.

FAQ

Event information FAQ

When is IEEE VLSI Test Symposium 2026?: 2026-04-27–2026-04-29. The organizer has not published a time in this record.
Where is IEEE VLSI Test Symposium 2026?: It is listed for Napa Marriott, Napa, CA, United States. Recheck the official guide and the map link below for the exact venue scope.
How do I register or attend?: A direct registration URL has not been officially verified in this record. Use the organizer’s page for the latest attendance instructions.
What does the event cover?: The record’s main searchable topics are Test / Reliability, Hardware Security, Advanced Packaging, Design / EDA. Use organizer-published materials for the detailed agenda.
How current is this information?: This page preserves 2 sources, including IEEE Test Technology Technical Council · official event page, and was last reviewed on 2026-08-19. Recheck the official page before booking.

VLSI Korea semiconductor observatory artwork used as an editorial topic image — RELATED EDITORIAL IMAGE · NOT THE EVENTVLSI Korea · VLSI Korea owned editorial artwork · CREDIT ↗

STRUCTURED RECORDvts-2026schema 1.0 · series vts · edition 2026

DATE: 2026-04-27 — 2026-04-29
TIME: All-day · detailed time not announced
TIME ZONE: America/Los_Angeles
Pacific Time · location derived
LOCATION: Napa Marriott · Napa, CA · United States
FORMAT: In person · Conference
CATEGORY: Industry & academia
ORGANIZER: IEEE Test Technology Technical Council
TOPICS: Test / Reliability · Hardware Security · Advanced Packaging · Design / EDA
VERIFICATION: OFFICIAL SOURCE · official association · 2026-08-19
NEXT REVIEW: 2027-02-15
COVERAGE: core

ATTENDEE INTELLIGENCE

Plan this event

Registration, travel, official materials and prior results in one record. We link verified resources only and never invent unpublished details.

01Attend / register

This edition has ended. Use the organizer’s page for the next edition and any published results.

CHECK OFFICIAL GUIDE ↗

Status: Check official status

02Programme, brochure & results

A programme or brochure appears here only after the organizer publishes an official source.

Prior-edition articles and result reports are linked in the archive below once their source is verified.

03Series profile & record stats

Cadence: Cadence not yet verified
First held: Not yet verified
Edition: Edition number not verified
Record series: vts

3Event days

2Verified sources

0Listed sessions

2Linked materials

These figures describe record coverage—duration, sources, sessions and materials—not attendee or exhibitor totals.

04Core topics & focus

These tags are searchable focus areas from the event record and VLSI Calendar taxonomy.

Test / ReliabilityHardware SecurityAdvanced PackagingDesign / EDA

CONTEXT & HISTORY

Previous editions and VLSI Korea coverage

Verified previous editions, official proceedings, attendee guides, recaps and technical deep dives are linked here.

Archive source verification in progress

No previous-edition article, result report or official archive link has yet been recorded with verified provenance. Rather than guessing, we link the organizer’s official page.

OFFICIAL EVENT PAGE ↗

PROVENANCE

Field-level source ledger

official confirmed · last checked 2026-08-19

PRIMARY · official eventIEEE Test Technology Technical Council · official event page

identity · dates · location · format · organizer

Retrieved 2026-08-19 ↗SECONDARY · editorialVLSI Korea · image source

media

Retrieved 2026-08-19 ↗

COMMUNITY SIGNAL

Community notes

Share attendee tips, impressions, or find someone to meet.

Loading…