When is International Test Conference 2026?

2026-10-11–2026-10-16. The organizer has not published a time in this record.

Where is International Test Conference 2026?

It is listed for San Antonio, TX, United States. Recheck the official guide and the map link below for the exact venue scope.

How do I register or attend?

A direct registration URL has not been officially verified in this record. Use the organizer’s page for the latest attendance instructions.

What does the event cover?

The record’s main searchable topics are Test / Reliability, Design / EDA. Use organizer-published materials for the detailed agenda.

How current is this information?

This page preserves 3 sources, including IEEE · official event page, and was last reviewed on 2026-08-19. Recheck the official page before booking.

2026-10-11 — 2026-10-16 · CROSS-CHECKED

Industry & academia

International Test Conference 2026

Conference organized by IEEE, focused on Test / Reliability, Design / EDA.

Registration

Check registration with the organizer

2026-10-11 → 2026-10-16 · San Antonio, TX

Early-bird deadline: Not published
Registration deadline: Not published

Check the organizer’s website ↗

WHEN2026-10-11 — 2026-10-16All-day · time not announced

WHERESan Antonio, TX · United StatesIn person · Conference

FOCUSTest / Reliability · Design / EDAIEEE

TRUSTCROSS-CHECKED3 sources · 2026-08-19

OFFICIAL PAGE ↗GOOGLE CALENDAR ＋APPLE / .ICS ↓WEEKLY EVENT BRIEFING ↗DEADLINE & CHANGE ALERT ↓

San Antonio, TX · United States

Plan your trip

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2026-10-11→ 2026-10-16

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Where to stay

San Antonio, TX

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Venue

San Antonio, TX

San Antonio, TX, United States

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While you’re there

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After the sessions

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EVENT BRIEFING

What to know before International Test Conference 2026

A decision-ready event record: confirmed logistics, attendance path, programme status and a traceable source trail.

EVENT OVERVIEW

International Test Conference 2026 is a in person conference organized by IEEE. This guide separates confirmed event facts from details the organizer has not yet published, so a visitor can make a practical attendance decision without treating a calendar listing as a promise.

This edition is listed for 2026-10-11–2026-10-16 in San Antonio, TX, United States. The record is organized around Test / Reliability, Design / EDA; use the official materials for the final programme, speaker line-up and any last-minute venue or registration changes.

FAQ

Event information FAQ

When is International Test Conference 2026?: 2026-10-11–2026-10-16. The organizer has not published a time in this record.
Where is International Test Conference 2026?: It is listed for San Antonio, TX, United States. Recheck the official guide and the map link below for the exact venue scope.
How do I register or attend?: A direct registration URL has not been officially verified in this record. Use the organizer’s page for the latest attendance instructions.
What does the event cover?: The record’s main searchable topics are Test / Reliability, Design / EDA. Use organizer-published materials for the detailed agenda.
How current is this information?: This page preserves 3 sources, including IEEE · official event page, and was last reviewed on 2026-08-19. Recheck the official page before booking.

VLSI Korea semiconductor observatory artwork used as an editorial topic image — RELATED EDITORIAL IMAGE · NOT THE EVENTVLSI Korea · VLSI Korea owned editorial artwork · CREDIT ↗

STRUCTURED RECORDinternational-test-conference-2026schema 1.0 · series international-test-conference · edition 2026

DATE: 2026-10-11 — 2026-10-16
TIME: All-day · detailed time not announced
TIME ZONE: America/Chicago
Central Time · location derived
LOCATION: San Antonio, TX · United States
FORMAT: In person · Conference
CATEGORY: Industry & academia
ORGANIZER: IEEE
TOPICS: Test / Reliability · Design / EDA
VERIFICATION: CROSS-CHECKED · industry calendar · 2026-08-19
NEXT REVIEW: 2026-09-18
COVERAGE: core

ATTENDEE INTELLIGENCE

Plan this event

Registration, travel, official materials and prior results in one record. We link verified resources only and never invent unpublished details.

01Attend / register

A direct registration URL has not yet been verified in this record. Check the official event page for attendance guidance.

CHECK OFFICIAL GUIDE ↗

Status: Check official status

02Programme, brochure & results

A programme or brochure appears here only after the organizer publishes an official source.

Prior-edition articles and result reports are linked in the archive below once their source is verified.

03Series profile & record stats

Cadence: Cadence not yet verified
First held: Not yet verified
Edition: Edition number not verified
Record series: international-test-conference

6Event days

3Verified sources

0Listed sessions

2Linked materials

These figures describe record coverage—duration, sources, sessions and materials—not attendee or exhibitor totals.

04Core topics & focus

These tags are searchable focus areas from the event record and VLSI Calendar taxonomy.

Test / ReliabilityDesign / EDA

CONTEXT & HISTORY

Previous editions and VLSI Korea coverage

Verified previous editions, official proceedings, attendee guides, recaps and technical deep dives are linked here.

Archive source verification in progress

No previous-edition article, result report or official archive link has yet been recorded with verified provenance. Rather than guessing, we link the organizer’s official page.

OFFICIAL EVENT PAGE ↗

PROVENANCE

Field-level source ledger

cross checked · last checked 2026-08-19

PRIMARY · official eventIEEE · official event page

identity · organizer

Retrieved 2026-08-19 ↗SECONDARY · industry calendarSemiconductor Engineering

identity · dates

Retrieved 2026-08-19 ↗SECONDARY · editorialVLSI Korea · image source

media

Retrieved 2026-08-19 ↗

COMMUNITY SIGNAL

Community notes

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International Test Conference 2026

Check registration with the organizer

Plan your trip

Before you go

San Antonio, TX

San Antonio, TX

While you’re there

Make the most of the gap between sessions

After the sessions

One more thing before you leave

Event information FAQ

Field-level source ledger

Alert me about this event

Similar semiconductor events

Community notes